UCC21755-Q1
- 5.7kVRMS single-channel isolated gate driver
- AEC-Q100 Qualified with the following results:
- Device temperature grade 1: -40°C to +125°C ambient operating temperature range
- Functional Safety Quality-Managed
- SiC MOSFETs and IGBTs up to 2121Vpk
- 33V maximum output drive voltage (VDD-VEE)
- ±10A drive strength and split output
- 150V/ns minimum CMTI
- 200ns response time fast DESAT protection with 5V threshold
- 4A internal active Miller clamp
- 400mA soft turn-off when fault happens
- Isolated analog sensor with PWM output for
- Temperature sensing with NTC, PTC, or thermal diode
- High voltage DC-link or phase voltage
- Alarm FLT on overcurrent and reset from RST/EN
- Fast enable/disable response on RST/EN
- Reject <40ns noise transient and pulse on input pins
- 12V VDD UVLO with power good on RDY
- Inputs/outputs with over- or under-shoot transient voltage immunity up to 5V
- 130ns (maximum) propagation delay and 30ns (maximum) pulse/part skew
- SOIC-16 DW package with creepage and clearance distance > 8mm
- Operating junction temperature –40°C to 150°C
The UCC21755-Q1 is a galvanic isolated single channel gate driver designed for SiC MOSFETs and IGBTs up to 2121V DC operating voltage with advanced protection features, best-in-class dynamic performance, and robustness. UCC21755-Q1 has up to ±10A peak source and sink current.
The input side is isolated from the output side with SiO2 capacitive isolation technology, supporting up to 1.5kVRMS working voltage, 12.8kVPK surge immunity with longer than 40-years isolation barrier life, as well as providing low part-to-part skew, and >150V/ns common mode noise immunity (CMTI).
The UCC21755-Q1 includes the state-of-art protection features, such as fast overcurrent and short circuit detection, fault reporting, active Miller clamp, and input and output side power supply UVLO to optimize SiC and IGBT switching behavior and robustness. The isolated analog to PWM sensor can be utilized for easier temperature or voltage sensing, further increasing the drivers’ versatility and simplifying the system design effort, size, and cost.
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可提供 UCC21755-Q1 功能安全手册以及功能安全时基故障率和引脚 FMA 报告。立即申请
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技术文档
类型 | 标题 | 下载最新的英语版本 | 日期 | |||
---|---|---|---|---|---|---|
* | 数据表 | UCC21755-Q1 Automotive 10A Source/Sink Reinforced Isolated Single Channel Gate Driver for SiC/IGBT with Active Protection, Isolated Analog Sensing and High-CMTI 数据表 (Rev. A) | PDF | HTML | 2024年 6月 17日 | ||
应用手册 | 驱动芯片退饱和保护(DESAT)应用指导 | 2024年 1月 3日 | ||||
证书 | UCC217xx/-Q1 CQC Certificate of Product Certification | 2023年 6月 7日 |
设计和开发
如需其他信息或资源,请点击以下任一标题进入详情页面查看(如有)。
UCC21750QDWEVM-025 — 适用于 SiC 和 IGBT 晶体管及电源模块的驱动和保护评估板
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封装 | 引脚 | CAD 符号、封装和 3D 模型 |
---|---|---|
SOIC (DW) | 16 | Ultra Librarian |
订购和质量
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- 引脚镀层/焊球材料
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- MTBF/时基故障估算
- 材料成分
- 鉴定摘要
- 持续可靠性监测
- 制造厂地点
- 封装厂地点
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