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SN74221

アクティブ

シュミット・トリガ入力、デュアル、モノステーブル・マルチバイブレータ

製品詳細

Number of channels 2 Supply voltage (min) (V) 4.75 Supply voltage (max) (V) 5.25 Technology family TTL Input type Schmitt-Trigger Output type Push-Pull Supply current (µA) 80000 IOL (max) (mA) 16 IOH (max) (mA) -0.8 Features Standard speed (tpd > 50ns) Operating temperature range (°C) 0 to 70 Rating Catalog
Number of channels 2 Supply voltage (min) (V) 4.75 Supply voltage (max) (V) 5.25 Technology family TTL Input type Schmitt-Trigger Output type Push-Pull Supply current (µA) 80000 IOL (max) (mA) 16 IOH (max) (mA) -0.8 Features Standard speed (tpd > 50ns) Operating temperature range (°C) 0 to 70 Rating Catalog
PDIP (N) 16 181.42 mm² 19.3 x 9.4
  • Dual Versions of Highly Stable SN54121 and SN74121 One Shots
  • SN54221 and SN74221 Demonstrate Electrical and Switching Characteristics That Are Virtually Identical to the SN54121 and SN74121 One Shots
  • Pinout Is Identical to the SN54123, SN74123, SN54LS123, and SN74LS123
  • Overriding Clear Terminates Output Pulse
  • Dual Versions of Highly Stable SN54121 and SN74121 One Shots
  • SN54221 and SN74221 Demonstrate Electrical and Switching Characteristics That Are Virtually Identical to the SN54121 and SN74121 One Shots
  • Pinout Is Identical to the SN54123, SN74123, SN54LS123, and SN74LS123
  • Overriding Clear Terminates Output Pulse

The '221 and 'LS221 devices are monolithic dual multivibrators with performance characteristics virtually identical to those of the '121 devices. Each multivibrator features a negative-transition- triggered input and a positive-transition-triggered input, either of which can be used as an inhibit input.

Pulse triggering occurs at a particular voltage level and is not directly related to the transition time of the input pulse. Schmitt-trigger input circuitry (TTL hysteresis) for B input allows jitter-free triggering from inputs with transition rates as slow as 1 V/s, providing the circuit with excellent noise immunity, typically of 1.2 V. A high immunity to VCC noise, typically of 1.5 V, is also provided by internal latching circuitry.

Once fired, the outputs are independent of further transitions of the A and B inputs and are a function of the timing components, or the output pulses can be terminated by the overriding clear. Input pulses can be of any duration relative to the output pulse. Output pulse length can be varied from 35 ns to the maximums shown in the above table by choosing appropriate timing components. With Rext = 2 k and Cext = 0, an output pulse typically of 30 ns is achieved, which can be used as a dc-triggered reset signal. Output rise and fall times are TTL compatible and independent of pulse length. Typical triggering and clearing sequences are shown as a part of the switching characteristics waveforms.

Pulse-width stability is achieved through internal compensation and is virtually independent of VCC and temperature. In most applications, pulse stability is limited only by the accuracy of external timing components.

Jitter-free operation is maintained over the full temperature and VCC ranges for more than six decades of timing capacitance (10 pF to 10 µF) and more than one decade of timing resistance (2 k can be used. Also, the range of jitter-free output pulse widths is extended if VCC is held to 5 V and free-air temperature is 25°C. Duty cycles as high as 90% are achieved when using maximum recommended RT. Higher duty cycles are available if a certain amount of pulse-width jitter is allowed.

The variance in output pulse width from device to device typically is less than ±0.5% for given external timing components. An example of this distribution for the '221 is shown in Figure 3. Variations in output pulse width versus supply voltage and temperature for the '221 are shown in Figures 4 and 5, respectively.

Pin assignments for these devices are identical to those of the SN54123/SN74123 or SN54LS123/SN74LS123 so that the '221 or 'LS221 devices can be substituted for those products in systems not using the retrigger by merely changing the value of Rext and/or Cext; however, the polarity of the capacitor must be changed.

The '221 and 'LS221 devices are monolithic dual multivibrators with performance characteristics virtually identical to those of the '121 devices. Each multivibrator features a negative-transition- triggered input and a positive-transition-triggered input, either of which can be used as an inhibit input.

Pulse triggering occurs at a particular voltage level and is not directly related to the transition time of the input pulse. Schmitt-trigger input circuitry (TTL hysteresis) for B input allows jitter-free triggering from inputs with transition rates as slow as 1 V/s, providing the circuit with excellent noise immunity, typically of 1.2 V. A high immunity to VCC noise, typically of 1.5 V, is also provided by internal latching circuitry.

Once fired, the outputs are independent of further transitions of the A and B inputs and are a function of the timing components, or the output pulses can be terminated by the overriding clear. Input pulses can be of any duration relative to the output pulse. Output pulse length can be varied from 35 ns to the maximums shown in the above table by choosing appropriate timing components. With Rext = 2 k and Cext = 0, an output pulse typically of 30 ns is achieved, which can be used as a dc-triggered reset signal. Output rise and fall times are TTL compatible and independent of pulse length. Typical triggering and clearing sequences are shown as a part of the switching characteristics waveforms.

Pulse-width stability is achieved through internal compensation and is virtually independent of VCC and temperature. In most applications, pulse stability is limited only by the accuracy of external timing components.

Jitter-free operation is maintained over the full temperature and VCC ranges for more than six decades of timing capacitance (10 pF to 10 µF) and more than one decade of timing resistance (2 k can be used. Also, the range of jitter-free output pulse widths is extended if VCC is held to 5 V and free-air temperature is 25°C. Duty cycles as high as 90% are achieved when using maximum recommended RT. Higher duty cycles are available if a certain amount of pulse-width jitter is allowed.

The variance in output pulse width from device to device typically is less than ±0.5% for given external timing components. An example of this distribution for the '221 is shown in Figure 3. Variations in output pulse width versus supply voltage and temperature for the '221 are shown in Figures 4 and 5, respectively.

Pin assignments for these devices are identical to those of the SN54123/SN74123 or SN54LS123/SN74LS123 so that the '221 or 'LS221 devices can be substituted for those products in systems not using the retrigger by merely changing the value of Rext and/or Cext; however, the polarity of the capacitor must be changed.

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技術資料

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種類 タイトル 最新の英語版をダウンロード 日付
* データシート SN54221, SN54LS221, SN74221, SN74LS221 データシート (Rev. B) 2004年 11月 9日
アプリケーション・ノート Designing With the SN74LVC1G123 Monostable Multivibrator (Rev. A) PDF | HTML 2020年 3月 13日
セレクション・ガイド Logic Guide (Rev. AB) 2017年 6月 12日
アプリケーション・ノート Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 2015年 12月 2日
セレクション・ガイド ロジック・ガイド (Rev. AA 翻訳版) 最新英語版 (Rev.AB) 2014年 11月 6日
ユーザー・ガイド LOGIC Pocket Data Book (Rev. B) 2007年 1月 16日
アプリケーション・ノート Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 2004年 7月 8日
アプリケーション・ノート Designing With Logic (Rev. C) 1997年 6月 1日
アプリケーション・ノート Input and Output Characteristics of Digital Integrated Circuits 1996年 10月 1日
アプリケーション・ノート Live Insertion 1996年 10月 1日

設計および開発

その他のアイテムや必要なリソースを参照するには、以下のタイトルをクリックして詳細ページをご覧ください。

評価ボード

14-24-LOGIC-EVM — 14 ピンから 24 ピンの D、DB、DGV、DW、DYY、NS、PW の各パッケージに封止した各種ロジック製品向けの汎用評価基板

14-24-logic-EVM 評価基板は、14 ピンから 24 ピンの D、DW、DB、NS、PW、DYY、DGV の各パッケージに封止した各種ロジック デバイスをサポートする設計を採用しています。

ユーザー ガイド: PDF | HTML
パッケージ ピン数 CAD シンボル、フットプリント、および 3D モデル
PDIP (N) 16 Ultra Librarian

購入と品質

記載されている情報:
  • RoHS
  • REACH
  • デバイスのマーキング
  • リード端子の仕上げ / ボールの原材料
  • MSL 定格 / ピーク リフロー
  • MTBF/FIT 推定値
  • 使用原材料
  • 認定試験結果
  • 継続的な信頼性モニタ試験結果
記載されている情報:
  • ファブの拠点
  • 組み立てを実施した拠点

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