LMG3426R030
- Qualified for JEDEC JEP180 for hard-switching topologies
- 600V GaN-on-Si FET with integrated gate driver
- Integrated high precision gate bias voltage
- 200V/ns FET hold-off
- 2.2MHz switching frequency
- 20V/ns to 150V/ns slew rate for optimization of switching performance and EMI mitigation
- Operates from 7.5V to 18V supply
- Robust protection
- Cycle-by-cycle overcurrent and latched short-circuit protection with < 100ns response
- Withstands 720V surge while hard-switching
- Self-protection from internal overtemperature and UVLO monitoring
- Advanced power management
- Digital temperature PWM output
- LMG3426R030 includes zero-voltage detection (ZVD) feature that facilitates soft-switching converters
- LMG3427R030 includes zero-current detection (ZCD) feature that facilitates soft-switching converters
The LMG342xR030 GaN FET with integrated driver and protection is targeted at switch-mode power converters and enables designers to achieve new levels of power density and efficiency.
The LMG342xR030 integrates a silicon driver that enables switching speed up to 150V/ns. TI’s integrated precision gate bias results in higher switching SOA compared to discrete silicon gate drivers. This integration, combined with TI’s low-inductance package, delivers clean switching and minimal ringing in hard-switching power supply topologies. Adjustable gate drive strength allows control of the slew rate from 20V/ns to 150V/ns, which can be used to actively control EMI and optimize switching performance. The LMG3426R030 includes the zero-voltage detection (ZVD) feature which provides a pulse output from the ZVD pin when zero-voltage switching is realized.The LMG3427R030 includes the zero-current detection (ZCD) feature which provides a pulse output from the ZCD pin when a positive drain-to-source current is detected .
Advanced power management features include digital temperature reporting and fault detection. The temperature of the GaN FET is reported through a variable duty cycle PWM output, which simplifies managing device loading. Faults reported include overcurrent, short-circuit, overtemperature, VDD UVLO, and high-impedance RDRV pin.
技术文档
类型 | 标题 | 下载最新的英语版本 | 日期 | |||
---|---|---|---|---|---|---|
* | 数据表 | LMG342xR030 600 V 30 mΩ GaN FET With Integrated Driver, Protection, and Temperature Reporting 数据表 (Rev. F) | PDF | HTML | 2024年 8月 27日 |
设计和开发
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LMG342X-BB-EVM — LMG342x 评估模块
LMG342X-BB-EVM 是易于使用的分线板,可将 LMG3422EVM-043 等各种 LMG342xR0x0 半桥板配置为同步降压转换器。通过提供功率级、辅助电源和逻辑电路,该评估模块 (EVM) 可用于快速测量氮化镓 (GaN) 器件的开关速度。该 EVM 能够在提供充分热管理(强制通风、低频运行等)的同时提供高达 12A 的输出电流,从而确保不超出最大工作温度。该 EVM 不适合用于瞬态测量,因为该板是开环板。
仅需要一个脉宽调制输入,即可在电路板上生成互补的脉宽调制信号和相应的死区时间。提供了探测点,从而可使用具有短接地弹簧的示波器探针测量关键逻辑和功率级波形。
LMG3422EVM-043 — LMG3422R030 600V 30mΩ 半桥子卡
封装 | 引脚 | CAD 符号、封装和 3D 模型 |
---|---|---|
VQFN (RQZ) | 54 | Ultra Librarian |
订购和质量
- RoHS
- REACH
- 器件标识
- 引脚镀层/焊球材料
- MSL 等级/回流焊峰值温度
- MTBF/时基故障估算
- 材料成分
- 鉴定摘要
- 持续可靠性监测
- 制造厂地点
- 封装厂地点